165 and JAMP-9500F
of our instruments, the XPS spectrometer Axis-165, and the Auger
Microprobe, JAMP-9500F are equipped with electron guns for Secondary
Electron Microscopy. The first uses thermal cathode, the second
is field -emission cold cathode. Please see instrument pages for
resolution and parameters.
In both instruments the sample is in UHV environment.
electron imaging of styrene balls in AXIS-165
Secondary Electron Microscopy of Au-particles in JAMP-9500F