Our XPS spectrometer

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Scanning Electron Microscopy

Instrumentation: Axis 165 and JAMP-9500F

Two of our instruments, the XPS spectrometer Axis-165, and the Auger Microprobe, JAMP-9500F are equipped with electron guns for Secondary Electron Microscopy. The first uses thermal cathode, the second is field -emission cold cathode. Please see instrument pages for resolution and parameters. In both instruments the sample is in UHV environment.

Example: Secondary electron imaging of styrene balls in AXIS-165

Example: Field-Emission Secondary Electron Microscopy of Au-particles in JAMP-9500F