Our instruments include:
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    AXIS 165, XPS Spectrometer equipped with ISS, AES, SEM, Cryo Module and Reaction/Catalysis Cell (Kratos)
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    AXIS Ultra, XPS Imaging Spectrometer equipped with ISS, TPD and UPS (Kratos)
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    ION-TOF IV, SIMS Imaging Spectrometer (ION-ToF GmbH)
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    JAMP-9500F, Scanning Auger Microprobe for FESEM / AES (JEOL) and EDXS (Oxford Instruments)

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    CM-20, Transmission Electron Microscope for TEM, STEM, Electron Diffraction (Philips) and EDXS ( Oxford Instruments)

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    Multifunctional System for HREELS, LEED, MBE, EBE (Specs, Createc)

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    UHV Deposition System for composite materials (custom designed, Createc)

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    FT-IR Nicolet 8700 , Fourrier Transform InfraRed Spectrometer with PEM (Nicolet - Thermo)

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    MFP-3D ,Atomic Force Microscope with PEM, temperature cell and optional mounting on inverted optical microscope stage ( Asylum Research)

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    Olympus 1X81, Inverted Fluorescence Microscope (Carsen)
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    Vega-3, Scanning Electron Microscope for SEM (Tescan) and EDXS (Oxford Instruments)
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    BX41LED, Digital Optical Microscope (Olympus)
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    FTA-200, Dynamic Contact Angle and Tension Analysis with environment cell (Ten Angströms - Folio)
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    AS-200, Profilometer (Tencor)