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Our
instruments include: |
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AXIS
165, XPS
Spectrometer equipped with ISS,
AES,
SEM,
Cryo Module and Reaction/Catalysis
Cell (Kratos) |
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AXIS
Ultra, XPS
Imaging Spectrometer
equipped with ISS,
TPD
and
UPS
(Kratos) |
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ION-TOF IV,
SIMS
Imaging Spectrometer (ION-ToF GmbH) |
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JAMP-9500F,
Scanning Auger Microprobe for FESEM
/ AES
(JEOL) and EDXS
(Oxford Instruments) |
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Multifunctional
System for HREELS,
LEED,
MBE,
EBE (Specs, Createc) |
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UHV Deposition
System for composite materials (custom designed, Createc) |
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FT-IR Nicolet 8700
, Fourrier Transform InfraRed
Spectrometer with PEM
(Nicolet - Thermo)
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MFP-3D
,Atomic Force Microscope with PEM, temperature cell and optional
mounting on inverted optical microscope stage
( Asylum Research) |
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Olympus
1X81, Inverted
Fluorescence Microscope (Carsen) |
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Vega-3,
Scanning Electron Microscope for SEM (Tescan) and EDXS (Oxford Instruments) |
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BX41LED,
Digital
Optical Microscope (Olympus) |
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FTA-200,
Dynamic Contact Angle and Tension Analysis with environment cell
(Ten Angströms - Folio) |
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AS-200, Profilometer
(Tencor) |
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