BACK to Instrumentation






































Axis 165 X-ray Photoelectron Spectrometer (Kratos Analytical)

Kratos Axis 165 X-ray Photoelectron Spectrometer with ISS and AES

Main Features:

  • High energy-resolution X-ray photoelectron spectroscopy (XPS)
  • Dual (Mg and Al) and Monochromatic (Al) X-ray sources
  • Sample processing chambers (pretreatment and catalysis cell)
  • Charge neutralization
  • Automated stage with cooling and heating options
  • Angle resolved XPS
  • Scanning Auger Electron Spectroscopy (AES)
  • Ion Scattering Spectroscopy (ISS)
  • Ion gun for depth-profiling and ISS
  • Imaging by Scanning Electron Microscopy (SEM)

Schematic drawing of the XPS spectrometer illustrates how it works in spectral mode. For more details you can visit the ULTRA overview pages provided by the manufacturer.

The rare combination of X-ray, ion, and electron guns gives us opportunity first to position the analyzer axis on fine features of the surface using SEM, and then analyze them with XPS using apertures as small as 30 microns. In addition, the combination of XPS with ISS and AES helps to complement the advantages of each of the techiques.

Samples and sample holders: Solid samples with dimensions less than 10mm x 13 mm x 4mm can be loaded. Maximum 22 mm diameter is allowed for AXIS-165, upto 2" for AXIS-ULTRA spectrometer. Several (up to 6-8) standard samples can be loaded on a single bar. Somewhat thicker samples can be accomodated on a special spring holder. Special holder stubs/cups are available for powder samples. Standard bar and stub holders are shown here. Although the shape of the sample is not important, flat surfaces yield higher signal. Conducting samples and substrates are preferred, although not necessary. Powder samples are analyzed best when pressed in pellets.

Catalysis cell : Attached to the back of the transfer chamber, the cell can be used for surface reactions. It can be cooled to LN temperature or heated to 800 degr. in a controlled gas environment. In-situ transfer of samples from the CatCell to the analysis chamber is available.

Location: CCIS, Rm. L2-356